Performance of capacitively coupled active pixel sensors in 180 nm HV-CMOS technology after irradiation to HL-LHC fluences
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Journal of Instrumentation
سال: 2014
ISSN: 1748-0221
DOI: 10.1088/1748-0221/9/03/c03020